Performance, Value, and Versatility:

IMOS profiler offers exceptional value with applications as varied as flatness, roughness, and waviness, step heights and more. 

IMOS profiler is equipped with a zoom head that can be populated with discrete zoom optics tailor-made for the system. Sample staging configurations range from completely to fully automated with encoded travel.

This universal system offers high-accuracy measurements, ease of use, and fast measurements, all at an attractive price point that makes it the ideal choice for versatility and value in 3D optical profilers.

Main advantages:

• Z-resolution in the nanorelief mode:

          ~ 30 pm (with atomically smoth mirror)

          ~ 0.3 μm in the microrelief mode;

• Compact;

• Fast response;

• Resistance to external vibrations;

• High degree of automation of the measurement process;

• Special user-friendly interface;

• High quality graphical interface to work with many-planned 3D-representations of measurement results;

• Wide possibilities of configuration of the microscope for various morphological-logics of measured surfaces;

• Ability to work in two modes: microrelief and nano-relief;

• Positioning of the object of measurement in three coordinates;

• Ability to measure large areas by cross-linking the results individual measurement;

• Unique system of storage and systematization of measurement results.