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IMOS interference microscope – nanoprofilometer
IMOS profiler offers exceptional value with applications as varied as flatness, roughness, and waviness, step heights and more.
IMOS profiler is equipped with a zoom head that can be populated with discrete zoom optics tailor-made for the system. Sample staging configurations range from completely to fully automated with encoded travel.
This universal system offers high-accuracy measurements, ease of use, and fast measurements, all at an attractive price point that makes it the ideal choice for versatility and value in 3D optical profilers.
~ 30 pm (with atomically smoth mirror)
~ 0.3 μm in the microrelief mode;
Compact;
Fast response;
Resistance to external vibrations;
High degree of automation of the measurement process;
Special user-friendly interface;
High quality graphical interface to work with many-planned 3D-representations of measurement results;
Wide possibilities of configuration of the microscope for various morphological-logics of measured surfaces;
Ability to work in two modes: microrelief and nano-relief;
Positioning of the object of measurement in three coordinates;
Ability to measure large areas by cross-linking the results individual measurement;
Unique system of storage and systematization of measurement results.